MANY-BEAM CALCULATION OF REFLECTION HIGH ENERGY ELECTRON DIFFRACTION (RHEED) INSENSITIES BY THE MULTI-SLICE METHODICHIMIYA A.1983; JAPANESE JOURNAL OF APPLIED PHYSICS; ISSN 0021-4922; JPN; DA. 1983; VOL. 22; NO 1; PP. 176-180; BIBL. 14 REF.Article

Bethe's correction method for dynamical calculation of reflection high-energy electron diffraction intensities from general surfacesICHIMIYA, A.Acta crystallographica. Section A, Foundations of crystallography. 1988, Vol 44, Num 6, pp 1042-1044, issn 0108-7673Article

RHEED intensities from stepped surfacesICHIMIYA, A.Surface science. 1987, Vol 187, Num 1, pp 194-200, issn 0039-6028Article

RHEED intensity analysis of Si(111)77 at one-beam conditionICHIMIYA, A.Surface science. 1987, Vol 192, Num 2-3, pp L893-L898, issn 0039-6028Article

Numerical convergence of dynamical calculations of reflection high-energy electron diffraction intensitiesICHIMIYA, A.Surface science. 1990, Vol 235, Num 1, pp 75-83, issn 0039-6028, 9 p.Article

DETERMINATION OF PHASE ANGLES AND ABSOLUTE VALUES OF THE STRUCTURE POTENTIAL V₀₀₀₂ OF CADMIUM SULFIDE FROM EQUAL THICKNESS FRINGES IN ELECTRON MICROGRAPHS.ICHIMIYA A; UYEDA R.1977; Z. NATURFORSCH., A; DTSCH.; DA. 1977; VOL. 32; NO 7; PP. 750-753; BIBL. 10 REF.Article

Analytical formula of imaginary crystal potential for fast electrons = Formule analytique d'un potentiel cristallin imaginaire pour des électrons rapidesICHIMIYA, A.Japanese journal of applied physics. 1985, Vol 24, Num 11, pp 1579-1580, issn 0021-4922, 1Article

INTENSITY ANOMALIES OF AUGER ELECTRON SIGNALS OBSERVED BY INCIDENT BEAM ROCKING METHOD FOR MAGNESIUM OXIDE (001) SURFACEICHIMIYA A; TAKEUCHI Y.1983; SURFACE SCIENCE; ISSN 0039-6028; NLD; DA. 1983; VOL. 128; NO 2-3; PP. 343-349; BIBL. 7 REF.Article

AXIAL CHANNELING IN ELECTRON DIFFRACTION.ICHIMIYA A; LEHMPFUHL G.1978; Z. NATURFORSCH., A; DTSCH.; DA. 1978; VOL. 33; NO 3; PP. 269-281; BIBL. 19 REF.Article

OBSERVATION OF THE SURFACE STATE RESONANCE EFFECT BY THE CONVERGENT BEAM RHEED TECHNIQUEICHIMIYA A; KAMBE K; LHEMPFUHL G et al.1980; J. PHYS. SOC. JPN.; ISSN 0031-9015; JPN; DA. 1980; VOL. 49; NO 2; PP. 684-688; BIBL. 6 REF.Article

X-RAY DIFFRACTION STUDY OF FINE GOLD PARTICLES PREPARED BY GAS EVAPORATION TECHNIQUE. I: GENERAL FEATURE = ETUDE PAR DIFFRACTION RX DE PARTICULES FINES D'OR PREPAREES PAR LA TECHNIQUE D'EVAPORATION GAZEUSE. I: CARACTERISTIQUE GENERALEHARADA J; YAO S; ICHIMIYA A et al.1980; J. PHYS. SOC. JPN.; ISSN 0031-9015; JPN; DA. 1980; VOL. 48; NO 5; PP. 1625-1630; BIBL. 13 REF.Article

ELECTRON MICROSCOPIC OBSERVATIONS OF SMALL GOLD CLUSTERS.MIHAMA K; TANAKA N; ICHIMIYA A et al.1977; J. PHYS., COLLOQ.; FR.; DA. 1977; NO 2; PP. 197-201; ABS. FR.; BIBL. 12 REF.; (CONF. INT. PETITES PARTICULES AMAS INORG.; LYON-VILLEURBANNE; 1976)Conference Paper

A DETERMINATION OF THE ABSOLUTE VALUES AND SIGNS OF THE 111 AND 222 STRUCTURE FACTORS OF SILICON.ANDO Y; ICHIMIYA A; UYEDA R et al.1974; ACTA CRYSTALLOGR., A; DANEM.; DA. 1974; VOL. 30; NO 4; PP. 600-601; BIBL. 10 REF.Article

Structural study of the Si(111)(√3X√3)R30°-Au surface using one-beam reflection high energy electron diffraction intensity rocking curve analysisKHRAMTSOVA, E. A; ICHIMIYA, A.Japanese journal of applied physics. 1997, Vol 36, Num 7B, pp L926-L928, issn 0021-4922, 2Article

Determination of the Si(111)1×1 structure at high temperature by reflection high-energy electron diffractionKOHMOTO, S; ICHIMIYA, A.Surface science. 1989, Vol 223, Num 3, pp 400-412, issn 0039-6028Article

RHEED intensity analysis of Si(111) 7×7-H surfaceICHIMIYA, A; MIZUNO, S.Surface science. 1987, Vol 191, Num 1-2, pp L765-L771, issn 0039-6028Article

Wave fields in Si(111) layers under RHEED conditionsHORIO, Y; ICHIMIYA, A.Surface science. 1996, Vol 348, Num 3, pp 344-358, issn 0039-6028Article

Phase shift and frequency doubling on intensity oscillations of reflection high-energy electron diffraction : one-beam dynamical calculations for Ge on Ge(111) surfaceHORIO, Y; ICHIMIYA, A.Japanese journal of applied physics. 1994, Vol 33, Num 3A, pp L377-L379, issn 0021-4922, 2Article

Structural study of Si growth on a Si(111)7 × 7 surfaceNAKAHARA, H; ICHIMIYA, A.Surface science. 1991, Vol 241, Num 1-2, pp 124-134, issn 0039-6028, 11 p.Article

Origin of phase shift phenomena in RHEED intensity oscillation curvesHORIO, Y; ICHIMIYA, A.Ultramicroscopy. 1994, Vol 55, Num 3, pp 321-328, issn 0304-3991Article

Silicon deposition on Si(111) surfaces at room temperature and effects of annealingNAKAHARA, H; ICHIMIYA, A.Journal of crystal growth. 1990, Vol 99, Num 1-4, pp 514-519, issn 0022-0248, 1Conference Paper

RHEED intensity analysis of Si(111) 7×7 and v3×v3-Ag surfaces. I: Kinematic diffraction approachHORIO, Y; ICHIMIYA, A.Surface science. 1983, Vol 133, Num 2-3, pp 393-400, issn 0039-6028Article

FUNCTIONAL AND STRUCTURAL BRAIN IMAGINGS IN DEMENTIAICHIMIYA, A.Psychiatry and clinical neurosciences (Carlton. Print). 1998, Vol 52, Num DEC, issn 1323-1316, Sans pagination, SUPConference Paper

Metastable structure of Si(111) surface during homoepitaxial growthNAKAHARA, H; ICHIMIYA, A.Surface science. 1991, Vol 242, Num 1-3, pp 162-165, issn 0039-6028, 4 p.Conference Paper

Kinematical analysis of RHEED intensities from the Si(111)7×7 structureHORIO, Y; ICHIMIYA, A.Surface science. 1989, Vol 219, Num 1-2, pp 128-142, issn 0039-6028, 15 p.Article